• 1304 Citations
  • 18 h-Index
1982 …2020

Research output per year

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Fingerprint Dive into the research topics where Hirofumi Shinohara is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

  • 1304 Citations
  • 18 h-Index
  • 52 Conference contribution
  • 41 Article
  • 6 Conference article
  • 1 Paper

A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in

Liu, K., Pu, H. & Shinohara, H., 2020 Mar, 2020 IEEE Custom Integrated Circuits Conference, CICC 2020. Institute of Electrical and Electronics Engineers Inc., 9075875. (Proceedings of the Custom Integrated Circuits Conference; vol. 2020-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS}} Bias-Based Dark-Bit Detection

    Liu, K., Min, Y., Yang, X., Sun, H. & Shinohara, H., 2020 Jun, In : IEEE Journal of Solid-State Circuits. 55, 6, p. 1719-1732 14 p., 8957039.

    Research output: Contribution to journalArticle

  • A CMOS 0.85-V 15.8-nW current and voltage reference without resistors

    Wang, J. & Shinohara, H., 2019 Apr, 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019. Institute of Electrical and Electronics Engineers Inc., 8741737. (2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A 373 F 2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique

    Liu, K., Min, Y., Yang, X., Sun, H. & Shinohara, H., 2018 Dec 14, 2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 161-164 4 p. 8579315. (2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2 Citations (Scopus)

    High-throughput von Neumann post-processing for random number generator

    Zhang, R., Chen, S., Wan, C. & Shinohara, H., 2018 Jun 5, 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 4 Citations (Scopus)