Engineering & Materials Science
Oxides
100%
Hot carriers
85%
Polysilicon
74%
Dynamic random access storage
71%
Boron
54%
Nitrogen
51%
Ion implantation
50%
Transistors
48%
Electric potential
47%
Static random access storage
47%
Leakage currents
46%
Silicon
44%
Oxide films
40%
Data storage equipment
35%
MOSFET devices
34%
Oxide semiconductors
32%
Threshold voltage
31%
Degradation
29%
Electrodes
26%
Substrates
25%
Nitridation
25%
Epitaxial films
23%
Metals
21%
Chemical vapor deposition
20%
Interface states
20%
Capacitance
19%
Electric fields
19%
Hot electrons
19%
Flash memory
18%
Networks (circuits)
17%
Deep level transient spectroscopy
17%
Oxidation
16%
Induced currents
15%
Atoms
15%
Drain current
15%
Analog circuits
15%
Alpha particles
14%
Ion beams
14%
Rapid thermal annealing
13%
Focused ion beams
13%
Vapors
13%
Field effect transistors
13%
Scalability
12%
Heavy metals
12%
Thin film transistors
12%
Defects
11%
Doping (additives)
11%
Masks
11%
Charge carriers
11%
Silicon on insulator technology
10%
Physics & Astronomy
CMOS
59%
implantation
44%
field effect transistors
39%
isolation
28%
oxides
26%
nitrogen
25%
metal oxide semiconductors
24%
leakage
21%
SOI (semiconductors)
21%
random access memory
18%
performance
18%
low voltage
16%
oxide films
16%
degradation
16%
boron
15%
transistors
15%
large scale integration
14%
traps
13%
silicon
12%
spacers
11%
ion implantation
11%
carrier injection
11%
cells
11%
logic
10%
retarding
10%
capacitance
9%
flash
9%
insulators
9%
proximity
9%
vapor deposition
8%
oxidation
7%
electrodes
7%
immunity
7%
micrometers
7%
diodes
7%
vapors
7%
systems-on-a-chip
7%
birds
6%
analog circuits
6%
electric potential
6%
dosage
6%
capacitors
6%
penetration
6%
indium phosphides
6%
energy
5%
heavy metals
5%
charge carriers
5%
bipolar transistors
5%
nitrogen atoms
5%
high speed
5%
Chemical Compounds
Voltage
36%
Nonconductor
34%
Leakage Current
26%
Oxide
23%
Parasitic
16%
Length
13%
Deep Level Transient Spectroscopy
12%
Behavior as Electrode
11%
Capacitor
11%
Ion Implantation
10%
Application
10%
Diffusion
9%
Nitrogen
8%
Electric Field
8%
Metal Oxide
8%
Gettering
7%
Indium Phosphide
7%
Interface State
7%
Semiconductor
7%
Surface
7%
Epitaxial Film
6%
Polycrystalline Solid
6%
Fluorescence Maxima
6%
Doping Material
6%
Clarification
6%
Sheet Resistance
5%
Liquid Film
5%
Chemical Vapour Deposition
5%
Hole Mobility
5%
Resistance
5%
Ion Beam
5%
Cryogenics
5%
Monte Carlo Method
5%