Masashi Tawada

次席研究員(研究院講師)

  • 29 Citations
  • 3 h-Index
20112019

Research output per year

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Research Output

  • 29 Citations
  • 3 h-Index
  • 11 Conference contribution
  • 8 Article

Efficient Ising Model Mapping to Solving Slot Placement Problem

Kanamaru, S., Oku, D., Tawada, M., Tanaka, S., Hayashi, M., Yamaoka, M., Yanagisawa, M. & Togawa, N., 2019 Mar 6, 2019 IEEE International Conference on Consumer Electronics, ICCE 2019. Institute of Electrical and Electronics Engineers Inc., 8661947. (2019 IEEE International Conference on Consumer Electronics, ICCE 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2 Citations (Scopus)

    Error Correction Coding of Stochastic Numbers Using BER Measurement

    Ishikawa, R., Tawada, M., Yanagisawa, M. & Togawa, N., 2019 Jul, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 243-246 4 p. 8854450. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 1 Citation (Scopus)

    2n RRR: Improved stochastic number duplicator based on bit re-arrangement

    Ishikawa, R., Tawada, M., Yanagisawa, M. & Togawa, N., 2018 Dec 10, 2018 New Generation of CAS, NGCAS 2018. Institute of Electrical and Electronics Engineers Inc., p. 182-185 4 p. 8572289

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • An Effective Stochastic Number Duplicator and Its Evaluations Using Composite Arithmetic Circuits

    Ishikawa, R., Tawada, M., Yanagisawa, M. & Togawa, N., 2018 Sep 26, 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018. Maniatakos, M., Alexandrescu, D., Gizopoulos, D. & Papavramidou, P. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 53-56 4 p. 8474263

    Research output: Chapter in Book/Report/Conference proceedingConference contribution