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Research Output 2016 2018

  • 1 Citations
  • 1 h-Index
  • 2 Conference contribution
  • 1 Article
2018
Soft Error
Trigger
Power Consumption
Electric power utilization
Double Sampling

Soft error tolerant latch designs with low power consumption (invited paper)

Tajima, S., Togawa, N., Yanagisawa, M. & Shi, Y., 2018 Jan 8, Proceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017. IEEE Computer Society, Vol. 2017-October. p. 52-55 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric power utilization
Semiconductor materials
Radiation
Electric potential
2016
1 Citation (Scopus)

A low-power soft error tolerant latch scheme

Tajima, S., Shi, Y., Togawa, N. & Yanagisawa, M., 2016 Jul 19, Proceedings - 2015 IEEE 11th International Conference on ASIC, ASICON 2015. Institute of Electrical and Electronics Engineers Inc., 7516885

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric power utilization
Integrated circuits
Capacitance
Networks (circuits)
Electric potential