• 1012 Citations
  • 16 h-Index
19972020

Research output per year

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Fingerprint Dive into the research topics where Takanobu Watanabe is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

  • 1012 Citations
  • 16 h-Index
  • 63 Article
  • 32 Conference contribution
  • 6 Conference article
  • 1 Editorial

Anomalous low energy phonon dispersion in bulk silicon-germanium observed by inelastic x-ray scattering

Yokogawa, R., Takeuchi, H., Arai, Y., Yonenaga, I., Tomita, M., Uchiyama, H., Watanabe, T. & Ogura, A., 2020 Jun 15, In : Applied Physics Letters. 116, 24, 242104.

Research output: Contribution to journalArticle

  • Effect of Thermal Boundary Resistance between the Interconnect Metal and Dielectric Interlayer on Temperature Increase of Interconnects in Deeply Scaled VLSI

    Zhan, T., Oda, K., Ma, S., Tomita, M., Jin, Z., Takezawa, H., Mesaki, K., Wu, Y. J., Xu, Y., Matsukawa, T., Matsuki, T. & Watanabe, T., 2020 May 13, In : ACS Applied Materials and Interfaces. 12, 19, p. 22347-22356 10 p.

    Research output: Contribution to journalArticle

  • 1 Citation (Scopus)

    Effect of the Thermal Boundary Resistance in Metal/Dielectric Thermally Conductive Layers on Power Generation of Silicon Nanowire Microthermoelectric Generators

    Zhan, T., Ma, S., Jin, Z., Takezawa, H., Mesaki, K., Tomita, M., Wu, Y. J., Xu, Y., Matsukawa, T., Matsuki, T. & Watanabe, T., 2020 Jul 29, In : ACS applied materials & interfaces. 12, 30, p. 34441-34450 10 p.

    Research output: Contribution to journalArticle

  • マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

    Translated title of the contribution: Direct observation of dielectric breakdown path at silica/epoxy interface with a micro-gap electrode deviceSankawa, R., Onishi, T., Takahashi, K., Tomita, M., Mura, K., Nakamura, T., Yoshimitsu, T., Imai, T. & Watanabe, T., 2020, In : IEEJ Transactions on Fundamentals and Materials. 140, 2, p. 64-69 6 p.

    Research output: Contribution to journalArticle

  • Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

    Takahashi, T., Fujita, D., Fukidome, H., Fukui, K. I., Hibino, H., Kageshima, M., Komeda, T., Nakajima, K., Nakamura, M., Nakayama, T., Nohira, H., Sasakawa, K., Sasaki, N., Sumitomo, K., Uchihashi, T., Watanabe, T. & Yamada, Y., 2019, In : Japanese journal of applied physics. 58, SI, SI0001.

    Research output: Contribution to journalEditorial

    Open Access