• 801 Citations
  • 17 h-Index
1979 …2020

Research output per year

If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Takashi Ohsawa is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 2 Similar Profiles

Research Output

  • 801 Citations
  • 17 h-Index
  • 30 Article
  • 23 Conference contribution
  • 9 Conference article
  • 5 Paper
  • Accurate measurement of sneak current in reram crossbar array with data storage pattern dependencies

    Shang, Y. & Ohsawa, T., 2019 Apr, 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019. Institute of Electrical and Electronics Engineers Inc., 8804668. (2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Cell array design with row-driven source line in block shunt architecture applicable to future 6f2 1t1mtj memory

    Huang, T. & Ohsawa, T., 2019 Apr, 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019. Institute of Electrical and Electronics Engineers Inc., 8804671. (2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Co-design of DNN model optimization for binary ReRAM array in-memory processing

    Guan, Y. & Ohsawa, T., 2019 May, 2019 IEEE 11th International Memory Workshop, IMW 2019. Institute of Electrical and Electronics Engineers Inc., 8739722. (2019 IEEE 11th International Memory Workshop, IMW 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2 Citations (Scopus)

    User-friendly compact model of magnetic tunnel junctions for circuit simulation based on switching probability

    Liu, H. & Ohsawa, T., 2019 Apr, 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019. Institute of Electrical and Electronics Engineers Inc., 8741646. (2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution