0.15 μm CMOS process for high performance and high reliability

S. Shimizu, T. Kuroi, M. Kobayashi, T. Yamaguchi, T. Fujino, H. Maeda, T. Tsutsumi, Y. Hirose, S. Kusunoki, M. Inuishi, N. Tsubouchi

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12 Citations (Scopus)

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