100.

C. Oshima, M. Aono, T. Tanaka, S. Kawai, R. Shimizu, H. Hagiwara

    Research output: Contribution to journalArticle

    20 Citations (Scopus)

    Abstract

    Thermionic emission patterns from the single-crystal LaB//6 left bracket 100 right bracket , left bracket 110 right bracket , left bracket 111 right bracket , and left bracket 210 right bracket tips have been observed under the Schottky condition. The observed emission patterns are interpreted on the basis of a model involving an anisotropic work function of LaB//6; the regions around the left bracket 111 right bracket crystal orientation have a high-work function, while those around the left bracket 210 right bracket crystal orientation have a low work function. This model also explains qualitatively the order of the total emission currents from those tips. The observed patterns predominantly consist of the emission from the conical face rather than the top of the tips under this experimental condition. Changes in the emission pattern and cathode surface in operation at 10** minus **4 Torr are also discussed.

    Original languageEnglish
    Pages (from-to)1201-1206
    Number of pages6
    JournalJournal of Applied Physics
    Volume51
    Issue number2
    DOIs
    Publication statusPublished - 1980 Feb

    Fingerprint

    brackets
    thermionic emission
    crystals
    cathodes

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Physics and Astronomy (miscellaneous)

    Cite this

    Oshima, C., Aono, M., Tanaka, T., Kawai, S., Shimizu, R., & Hagiwara, H. (1980). 100. Journal of Applied Physics, 51(2), 1201-1206. https://doi.org/10.1063/1.327688

    100. / Oshima, C.; Aono, M.; Tanaka, T.; Kawai, S.; Shimizu, R.; Hagiwara, H.

    In: Journal of Applied Physics, Vol. 51, No. 2, 02.1980, p. 1201-1206.

    Research output: Contribution to journalArticle

    Oshima, C, Aono, M, Tanaka, T, Kawai, S, Shimizu, R & Hagiwara, H 1980, '100.', Journal of Applied Physics, vol. 51, no. 2, pp. 1201-1206. https://doi.org/10.1063/1.327688
    Oshima C, Aono M, Tanaka T, Kawai S, Shimizu R, Hagiwara H. 100. Journal of Applied Physics. 1980 Feb;51(2):1201-1206. https://doi.org/10.1063/1.327688
    Oshima, C. ; Aono, M. ; Tanaka, T. ; Kawai, S. ; Shimizu, R. ; Hagiwara, H. / 100. In: Journal of Applied Physics. 1980 ; Vol. 51, No. 2. pp. 1201-1206.
    @article{442ed4f2a89a411aac86a6b146ede17e,
    title = "100.",
    abstract = "Thermionic emission patterns from the single-crystal LaB//6 left bracket 100 right bracket , left bracket 110 right bracket , left bracket 111 right bracket , and left bracket 210 right bracket tips have been observed under the Schottky condition. The observed emission patterns are interpreted on the basis of a model involving an anisotropic work function of LaB//6; the regions around the left bracket 111 right bracket crystal orientation have a high-work function, while those around the left bracket 210 right bracket crystal orientation have a low work function. This model also explains qualitatively the order of the total emission currents from those tips. The observed patterns predominantly consist of the emission from the conical face rather than the top of the tips under this experimental condition. Changes in the emission pattern and cathode surface in operation at 10** minus **4 Torr are also discussed.",
    author = "C. Oshima and M. Aono and T. Tanaka and S. Kawai and R. Shimizu and H. Hagiwara",
    year = "1980",
    month = "2",
    doi = "10.1063/1.327688",
    language = "English",
    volume = "51",
    pages = "1201--1206",
    journal = "Journal of Applied Physics",
    issn = "0021-8979",
    publisher = "American Institute of Physics Publising LLC",
    number = "2",

    }

    TY - JOUR

    T1 - 100.

    AU - Oshima, C.

    AU - Aono, M.

    AU - Tanaka, T.

    AU - Kawai, S.

    AU - Shimizu, R.

    AU - Hagiwara, H.

    PY - 1980/2

    Y1 - 1980/2

    N2 - Thermionic emission patterns from the single-crystal LaB//6 left bracket 100 right bracket , left bracket 110 right bracket , left bracket 111 right bracket , and left bracket 210 right bracket tips have been observed under the Schottky condition. The observed emission patterns are interpreted on the basis of a model involving an anisotropic work function of LaB//6; the regions around the left bracket 111 right bracket crystal orientation have a high-work function, while those around the left bracket 210 right bracket crystal orientation have a low work function. This model also explains qualitatively the order of the total emission currents from those tips. The observed patterns predominantly consist of the emission from the conical face rather than the top of the tips under this experimental condition. Changes in the emission pattern and cathode surface in operation at 10** minus **4 Torr are also discussed.

    AB - Thermionic emission patterns from the single-crystal LaB//6 left bracket 100 right bracket , left bracket 110 right bracket , left bracket 111 right bracket , and left bracket 210 right bracket tips have been observed under the Schottky condition. The observed emission patterns are interpreted on the basis of a model involving an anisotropic work function of LaB//6; the regions around the left bracket 111 right bracket crystal orientation have a high-work function, while those around the left bracket 210 right bracket crystal orientation have a low work function. This model also explains qualitatively the order of the total emission currents from those tips. The observed patterns predominantly consist of the emission from the conical face rather than the top of the tips under this experimental condition. Changes in the emission pattern and cathode surface in operation at 10** minus **4 Torr are also discussed.

    UR - http://www.scopus.com/inward/record.url?scp=0018980685&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=0018980685&partnerID=8YFLogxK

    U2 - 10.1063/1.327688

    DO - 10.1063/1.327688

    M3 - Article

    AN - SCOPUS:0018980685

    VL - 51

    SP - 1201

    EP - 1206

    JO - Journal of Applied Physics

    JF - Journal of Applied Physics

    SN - 0021-8979

    IS - 2

    ER -