130-mm2, 256-Mbit NAND flash with shallow trench isolation technology

Kenichi Imamiya, Yoshihisa Sugiura, Hiroshi Nakamura, Toshihiko Himeno, Ken Takeuchi, Tamio Ikehashi, Kazushige Kanda, Koji Hosono, Riichiro Shirota, Seiichi Aritome, Kazuhiro Shimizu, Kazuo Hatakeyama, Koji Sakui

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

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Engineering & Materials Science