A 1-V 46-ns 16-Mb SOI-DRAM with body control technique

Ken'ichi Shimomura; Hiroki Shimano; Narumi Sakashita; Fumihiro Okuda; Toshiyuki Oashi; Yasuo Yamaguchi; Takahisa Eimori; Masahide Inuishi; Kazutami Arimoto; Shigeto Maegawa; Yasuo Inoue; Shinji Komori; Kazuo Kyuma

doi:10.1109/4.641691

A 1-V 46-ns 16-Mb SOI-DRAM with body control technique

Ken'ichi Shimomura, Hiroki Shimano, Narumi Sakashita, Fumihiro Okuda, Toshiyuki Oashi, Yasuo Yamaguchi, Takahisa Eimori, Masahide Inuishi, Kazutami Arimoto, Shigeto Maegawa, Yasuo Inoue, Shinji Komori, Kazuo Kyuma

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

A low-voltage high-speed 16-Mb SOI-DRAM has been developed using a 0.5-μm CMOS/SIMOX technology. A newly introduced "FD-PD mode switching" transistor dynamically switches its operation mode between fully depleted (FD) and partially depleted (PD) according to the body bias voltage, thus it has both PD-mode large current drivability and FD-mode small leakage current. By the body bias control, the transistor operates as if it has an S-factor of 30 mV/decade. Enabling both high speed and low power at a low voltage, 30 mV is only one-half the theoretical value. By utilizing the transistor, we have developed body pulsed sense amplifier (BPS), body driven equalizer (BDEQ), body current clamper (BCC), and body pulsed transistor logic (BPTL) to achieve 46 ns access time at 1 V power supply with suppressed standby current.

Original language	English
Pages (from-to)	1712-1718
Number of pages	7
Journal	IEEE Journal of Solid-State Circuits
Volume	32
Issue number	11
DOIs	https://doi.org/10.1109/4.641691
Publication status	Published - 1997 Nov
Externally published	Yes

Fingerprint

Dynamic random access storage

Transistors

Electric potential

Equalizers

Bias voltage

Leakage currents

Switches

Keywords

Circuit simulation
CMOS integrated circuits
DRAM chips
Integrated circuit design
Silicon-on-insulator technology

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Shimomura, K., Shimano, H., Sakashita, N., Okuda, F., Oashi, T., Yamaguchi, Y., ... Kyuma, K. (1997). A 1-V 46-ns 16-Mb SOI-DRAM with body control technique. IEEE Journal of Solid-State Circuits, 32(11), 1712-1718. https://doi.org/10.1109/4.641691

A 1-V 46-ns 16-Mb SOI-DRAM with body control technique. / Shimomura, Ken'ichi; Shimano, Hiroki; Sakashita, Narumi; Okuda, Fumihiro; Oashi, Toshiyuki; Yamaguchi, Yasuo; Eimori, Takahisa; Inuishi, Masahide; Arimoto, Kazutami; Maegawa, Shigeto; Inoue, Yasuo; Komori, Shinji; Kyuma, Kazuo.

In: IEEE Journal of Solid-State Circuits, Vol. 32, No. 11, 11.1997, p. 1712-1718.

Research output: Contribution to journal › Article

Shimomura, K, Shimano, H, Sakashita, N, Okuda, F, Oashi, T, Yamaguchi, Y, Eimori, T, Inuishi, M, Arimoto, K, Maegawa, S, Inoue, Y, Komori, S & Kyuma, K 1997, 'A 1-V 46-ns 16-Mb SOI-DRAM with body control technique', IEEE Journal of Solid-State Circuits, vol. 32, no. 11, pp. 1712-1718. https://doi.org/10.1109/4.641691

Shimomura K, Shimano H, Sakashita N, Okuda F, Oashi T, Yamaguchi Y et al. A 1-V 46-ns 16-Mb SOI-DRAM with body control technique. IEEE Journal of Solid-State Circuits. 1997 Nov;32(11):1712-1718. https://doi.org/10.1109/4.641691

Shimomura, Ken'ichi ; Shimano, Hiroki ; Sakashita, Narumi ; Okuda, Fumihiro ; Oashi, Toshiyuki ; Yamaguchi, Yasuo ; Eimori, Takahisa ; Inuishi, Masahide ; Arimoto, Kazutami ; Maegawa, Shigeto ; Inoue, Yasuo ; Komori, Shinji ; Kyuma, Kazuo. / A 1-V 46-ns 16-Mb SOI-DRAM with body control technique. In: IEEE Journal of Solid-State Circuits. 1997 ; Vol. 32, No. 11. pp. 1712-1718.

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Access to Document

10.1109/4.641691