A 45-ns 64-Mb DRAM with a merged match-line test architecture

Shigeru Mori, Hiroshi Miyamoto, Yoshikazu Morooka, Shigeru Kikuda, Makoto Suwa, Mitsuya Kinoshita, Atsushi Hachisuka, Hideaki Arima, Michihiro Yamada, Tsutomu Yoshihara, Shimpei Kayano

Research output: Contribution to journalArticle

9 Citations (Scopus)

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Engineering & Materials Science