A 667-Mb/s operating digital DLL architecture for 512-Mb DDR SDRAM

Takeshi Hamamoto; Kiyohiro Furutani; Takashi Kubo; Satoshi Kawasaki; Hironori Iga; Takashi Kono; Yasuhiro Konishi; Tsutomu Yoshihara

doi:10.1109/JSSC.2003.820851

A 667-Mb/s operating digital DLL architecture for 512-Mb DDR SDRAM

Takeshi Hamamoto, Kiyohiro Furutani, Takashi Kubo, Satoshi Kawasaki, Hironori Iga, Takashi Kono, Yasuhiro Konishi, Tsutomu Yoshihara

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

Abstract

This paper describes an all-digital delay-locked loop (DLL) architecture for over 667 Mb/s operating double-data-rate (DDR) type SDRAMs, which suppresses skews and jitters. Two novel replica adjusting techniques are introduced, in which timing skews caused by the clock input and data output circuits are reduced by a hierarchical phase comparing architecture and a replica check method with slow tester. Further, an improved phase interpolating method suppresses jitters caused by a boundary of the fine and coarse delays. A 512-Mb test device is fabricated using a 0.13-μm DRAM process technology, in which skew and jitter suppressed 667-Mb/s (333-MHz) DDR operation has been verified.

Original language	English
Pages (from-to)	194-206
Number of pages	13
Journal	IEEE Journal of Solid-State Circuits
Volume	39
Issue number	1
DOIs	https://doi.org/10.1109/JSSC.2003.820851
Publication status	Published - 2004 Jan
Externally published	Yes

Keywords

Delay lines
Delay-locked loops (DLLs)
DRAM chips
High-speed techniques
Jitter

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/JSSC.2003.820851

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Cite this

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abstract = "This paper describes an all-digital delay-locked loop (DLL) architecture for over 667 Mb/s operating double-data-rate (DDR) type SDRAMs, which suppresses skews and jitters. Two novel replica adjusting techniques are introduced, in which timing skews caused by the clock input and data output circuits are reduced by a hierarchical phase comparing architecture and a replica check method with slow tester. Further, an improved phase interpolating method suppresses jitters caused by a boundary of the fine and coarse delays. A 512-Mb test device is fabricated using a 0.13-μm DRAM process technology, in which skew and jitter suppressed 667-Mb/s (333-MHz) DDR operation has been verified.",

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AU - Iga, Hironori

AU - Kono, Takashi

AU - Konishi, Yasuhiro

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