A closed-form expression for estimating minimum operating voltage (V DDmin) of CMOS logic gates

Hiroshi Fuketa; Satoshi Iida; Tadashi Yasufuku; Makoto Takamiya; Masahiro Nomura; Hirofumi Shinohara; Takayasu Sakurai

doi:10.1145/2024724.2024942

A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates

Hiroshi Fuketa, Satoshi Iida, Tadashi Yasufuku, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

21 Citations (Scopus)

Abstract

In this paper, a closed-form expression for estimating a minimum operating voltage (V_DDmin) of CMOS logic gates is proposed. V_DDmin is defined as the minimum supply voltage at which circuits can operate correctly. V_DDmin of combinational circuits can be written as a linear function of the square-root of logarithm of the number of logic gates and its slope is proportional to the standard deviation of the within-die variation in the threshold voltage difference between PMOS and NMOS transistors. The proposed expression is verified with Monte Carlo simulations using various gate chains. The verification reveals that V_DDmin of inverter chains can be estimated within 11% error. The expression is also verified with silicon measurements in a 65nm CMOS process

Original language	English
Title of host publication	2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	984-989
Number of pages	6
ISBN (Print)	9781450306362
DOIs	https://doi.org/10.1145/2024724.2024942
Publication status	Published - 2011 Jan 1
Externally published	Yes

Publication series

Name	Proceedings - Design Automation Conference
ISSN (Print)	0738-100X

Keywords

Minimum operating voltage
subthreshold circuits
variations

ASJC Scopus subject areas

Computer Science Applications
Control and Systems Engineering
Electrical and Electronic Engineering
Modelling and Simulation

Access to Document

10.1145/2024724.2024942

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Fuketa, H., Iida, S., Yasufuku, T., Takamiya, M., Nomura, M., Shinohara, H., & Sakurai, T. (2011). A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates. In 2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011 (pp. 984-989). [5981890] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/2024724.2024942

A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates. / Fuketa, Hiroshi; Iida, Satoshi; Yasufuku, Tadashi; Takamiya, Makoto; Nomura, Masahiro; Shinohara, Hirofumi; Sakurai, Takayasu.

2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011. Institute of Electrical and Electronics Engineers Inc., 2011. p. 984-989 5981890 (Proceedings - Design Automation Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fuketa, H, Iida, S, Yasufuku, T, Takamiya, M, Nomura, M, Shinohara, H & Sakurai, T 2011, A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates. in 2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011., 5981890, Proceedings - Design Automation Conference, Institute of Electrical and Electronics Engineers Inc., pp. 984-989. https://doi.org/10.1145/2024724.2024942

Fuketa H, Iida S, Yasufuku T, Takamiya M, Nomura M, Shinohara H et al. A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates. In 2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011. Institute of Electrical and Electronics Engineers Inc. 2011. p. 984-989. 5981890. (Proceedings - Design Automation Conference). https://doi.org/10.1145/2024724.2024942

Fuketa, Hiroshi ; Iida, Satoshi ; Yasufuku, Tadashi ; Takamiya, Makoto ; Nomura, Masahiro ; Shinohara, Hirofumi ; Sakurai, Takayasu. / A closed-form expression for estimating minimum operating voltage (V _DDmin) of CMOS logic gates. 2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011. Institute of Electrical and Electronics Engineers Inc., 2011. pp. 984-989 (Proceedings - Design Automation Conference).

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