A counting CdTe pixel detector for hard x-ray and γ-ray imaging

P. Fischer, M. Kouda, H. Krüger, M. Lindner*, G. Sato, T. Takahashi, S. Watanabe, N. Wermes

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

A 0.5-mm-thick Cadmium Telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting pixel read out chip (MPEC 2.1) using a special gold-stud technique. The pixel size is 200 × 200 μm2, the active area is 6.4 × 6.4 mm2. The successful operation of this high-Z imaging pixel device is demonstrated. Noise and threshold dispersion as well as the imaging performance are reported.

Original languageEnglish
Pages (from-to)2401-2404
Number of pages4
JournalIEEE Transactions on Nuclear Science
Volume48
Issue number6 III
DOIs
Publication statusPublished - 2001 Dec

Keywords

  • Cadmium telluride (CdTe)
  • Counting
  • Imaging
  • Pixel
  • X-ray

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

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