A counting CdTe pixel detector for hard x-ray and γ-ray imaging

P. Fischer, M. Kouda, H. Krüger, M. Lindner, G. Sato, T. Takahashi, S. Watanabe, N. Wermes

Research output: Contribution to journalArticle

17 Citations (Scopus)


A 0.5-mm-thick Cadmium Telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting pixel read out chip (MPEC 2.1) using a special gold-stud technique. The pixel size is 200 × 200 μm2, the active area is 6.4 × 6.4 mm2. The successful operation of this high-Z imaging pixel device is demonstrated. Noise and threshold dispersion as well as the imaging performance are reported.

Original languageEnglish
Pages (from-to)2401-2404
Number of pages4
JournalIEEE Transactions on Nuclear Science
Issue number6 III
Publication statusPublished - 2001 Dec



  • Cadmium telluride (CdTe)
  • Counting
  • Imaging
  • Pixel
  • X-ray

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Fischer, P., Kouda, M., Krüger, H., Lindner, M., Sato, G., Takahashi, T., Watanabe, S., & Wermes, N. (2001). A counting CdTe pixel detector for hard x-ray and γ-ray imaging. IEEE Transactions on Nuclear Science, 48(6 III), 2401-2404. https://doi.org/10.1109/23.983249