A detector for charged particle counting in the presence of strong electromagnetic noise

Shigeyuki Sekine, Shingo Ichimura

Research output: Contribution to journalArticle

Abstract

An electron/ion pulse counting system was used for a high-counting-rate application under strong electromagnetic noise. The number of photoelectrons produced by a nonresonant multiphoton ionization of gaseous molecules was counted as a function of gas pressure in vacuum. The system was successfully operated under electromagnetic noise originated from a pulsed laser. The detector acted as a gated, accumulating counter with a capacity of 300 cps. A maximum counting rate of 2×1010 cps was experimentally achieved when laser-produced photoelectrons arrived within a gate of 15 ns.

Original languageEnglish
Pages (from-to)325-X
JournalReview of Scientific Instruments
Volume67
Issue number1
Publication statusPublished - 1996 Jan 1
Externally publishedYes

Fingerprint

electromagnetic noise
Charged particles
Photoelectrons
counting
charged particles
Detectors
detectors
photoelectrons
Pulsed lasers
Ionization
Vacuum
Molecules
gas pressure
Electrons
Lasers
pulsed lasers
Ions
counters
Gases
ionization

ASJC Scopus subject areas

  • Instrumentation

Cite this

A detector for charged particle counting in the presence of strong electromagnetic noise. / Sekine, Shigeyuki; Ichimura, Shingo.

In: Review of Scientific Instruments, Vol. 67, No. 1, 01.01.1996, p. 325-X.

Research output: Contribution to journalArticle

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