A heuristic search method with the reduced list of test error patterns for maximum likelihood decoding

Hideki Yagi, Toshiyasu Matsushima, Shigeichi Hirasawa

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The reliability-based heuristic search methods for maximum likelihood decoding (MLD) generate test error patterns (or, equivalently, candidate codewords) according to their heuristic values. Test error patterns are stored in lists and its space complexity is crucially large for MLD of long block codes. Based on the decoding algorithms both of Battail and Fang and of its generalized version suggested by Valembois and Fossorier, we propose a new method for reducing the space complexity of the heuristic search methods for MLD including the well-known decoding algorithm of Han et al. If the heuristic function satisfies a certain condition, the proposed method guarantees to reduce the space complexity of both the Battail-Fang and Han et al. decoding algorithms. Simulation results show the high efficiency of the proposed method.

Original languageEnglish
Pages (from-to)2721-2732
Number of pages12
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE88-A
Issue number10
DOIs
Publication statusPublished - 2005 Oct

Keywords

  • Binary block codes
  • Heuristic search
  • Maximum likelihood decoding
  • Most reliable basis
  • Reliability

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

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