A large-solid-angle electron energy analyzer (II)

Takeshi Nakajima; Daisuke Miura; Kenta Yamamura; Yoshimasa Nihei; Chuhei Oshima

A large-solid-angle electron energy analyzer (II)

Takeshi Nakajima^*, Daisuke Miura, Kenta Yamamura, Yoshimasa Nihei, Chuhei Oshima

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

Abstract

By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB₂ (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å^-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E₀ of the analyzer were 0.017-0.022 depending on the incidence angle.

Original language	English
Pages (from-to)	2-6
Number of pages	5
Journal	Shinku/Journal of the Vacuum Society of Japan
Volume	47
Issue number	1
Publication status	Published - 2004

ASJC Scopus subject areas

Electrical and Electronic Engineering
Surfaces and Interfaces

Cite this

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T1 - A large-solid-angle electron energy analyzer (II)

AU - Nakajima, Takeshi

AU - Miura, Daisuke

AU - Yamamura, Kenta

AU - Nihei, Yoshimasa

AU - Oshima, Chuhei

PY - 2004

Y1 - 2004

N2 - By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.

AB - By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.

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A large-solid-angle electron energy analyzer (II)

Abstract

ASJC Scopus subject areas

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