A low-kickback-noise latched comparator for high-speed flash analog-to-digital converters

Jia Chen*, Satoshi Kurachi, Shimin Shen, Haiwen Liu, Toshihiko Yoshimasu, Yong Ju Suh

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

In traditional comparators especially for flash ADCs, one serious problem is the kick back noise, which disturbs the input signal voltages and consequently might cause errors at the outputs of the ADCs. In this paper, we propose a novel CMOS latched comparator with very low kickback noise for high-speed flash ADCs. The proposed comparator separates analog preamplifier from the positive feedback digital dynamic latch so as to reduce the influence of the kickback noise. Simulation results based on a mixed signal CMOS 0.35um technology show that, this comparator can work at a maximum clock frequency of 500MHz with very reduced kickback noise compared with conventional architectures.

Original languageEnglish
Title of host publicationISCIT 2005 - International Symposium on Communications and Information Technologies 2005, Proceedings
Pages250-253
Number of pages4
DOIs
Publication statusPublished - 2005
EventISCIT 2005 - International Symposium on Communications and Information Technologies 2005 - Beijing, China
Duration: 2005 Oct 122005 Oct 14

Publication series

NameISCIT 2005 - International Symposium on Communications and Information Technologies 2005, Proceedings
VolumeII

Conference

ConferenceISCIT 2005 - International Symposium on Communications and Information Technologies 2005
Country/TerritoryChina
CityBeijing
Period05/10/1205/10/14

Keywords

  • ADCs
  • Kickback noise
  • Latched comparator

ASJC Scopus subject areas

  • Engineering(all)

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