A metric for measuring the abstraction level of design patterns

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

    Original languageEnglish
    Title of host publicationACM International Conference Proceeding Series
    DOIs
    Publication statusPublished - 2007
    Event14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL
    Duration: 2007 Sep 52007 Sep 8

    Other

    Other14th Conference on Pattern Languages of Programs, PLoP '07
    CityMonticello, IL
    Period07/9/507/9/8

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    Visualization

    Keywords

    • interpattern relationships
    • patterns

    ASJC Scopus subject areas

    • Human-Computer Interaction
    • Computer Networks and Communications
    • Computer Vision and Pattern Recognition
    • Software

    Cite this

    A metric for measuring the abstraction level of design patterns. / Kubo, Atsuto; Washizaki, Hironori; Fukazawa, Yoshiaki.

    ACM International Conference Proceeding Series. 2007. 1772093.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kubo, A, Washizaki, H & Fukazawa, Y 2007, A metric for measuring the abstraction level of design patterns. in ACM International Conference Proceeding Series., 1772093, 14th Conference on Pattern Languages of Programs, PLoP '07, Monticello, IL, 07/9/5. https://doi.org/10.1145/1772070.1772093
    Kubo, Atsuto ; Washizaki, Hironori ; Fukazawa, Yoshiaki. / A metric for measuring the abstraction level of design patterns. ACM International Conference Proceeding Series. 2007.
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