A metric for measuring the abstraction level of design patterns

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

Original languageEnglish
Title of host publicationPLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings
DOIs
Publication statusPublished - 2007 Dec 1
Event14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL, United States
Duration: 2007 Sep 52007 Sep 8

Publication series

NameACM International Conference Proceeding Series

Conference

Conference14th Conference on Pattern Languages of Programs, PLoP '07
CountryUnited States
CityMonticello, IL
Period07/9/507/9/8

Keywords

  • interpattern relationships
  • patterns

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

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