A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum

Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Taisuke Nakanaga, Shingo Ichimura

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Electrospray characteristics were studied using a pure room-temperature molten salt (i.e., an ionic liquid) at pressures around 10-5 Pa as well as at atmospheric pressure. The ionic liquid N,N-diethyl-N-methyl-N-(2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl)imide was tested, which has negligible vapor pressure and high conductivity. During electrospray, the ionic liquid was introduced at a constant flow rate into a stainless-steel capillary (i.d. 30 μm). It was demonstrated that stable electrosprayed currents exceeding ±1 μΑ were continuously produced in both positive and negative modes. The electrosprayed currents in a high vacuum were twice those at atmospheric pressure. It was found that gas pressure rose slightly with increasing electrosprayed currents. Residual gas analysis revealed that gas component at negative mode was different from that at positive mode. Experimental results indicate that vacuum electrospray of pure ionic liquids is applicable to a massive-cluster beam source for SIMS.

Original languageEnglish
Pages (from-to)1938-1941
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume268
Issue number11-12
DOIs
Publication statusPublished - 2010 Jun 1
Externally publishedYes

Fingerprint

Secondary ion mass spectrometry
high vacuum
Ionic liquids
Ion beams
secondary ion mass spectrometry
ion beams
Vacuum
liquids
Atmospheric pressure
atmospheric pressure
Gas fuel analysis
gas analysis
residual gas
molten salts
imides
Vapor pressure
Gases
vapor pressure
gas pressure
Molten materials

Keywords

  • Charged droplet
  • Cluster ion
  • Electrospray
  • Ion beam
  • Ionic liquid
  • SIMS

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum. / Fujiwara, Yukio; Saito, Naoaki; Nonaka, Hidehiko; Nakanaga, Taisuke; Ichimura, Shingo.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 268, No. 11-12, 01.06.2010, p. 1938-1941.

Research output: Contribution to journalArticle

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