A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li, Chen Hu, Jun Yang, Zhe Zhang, Youhua Shi, Longxing Shi

Research output: Contribution to conferencePaper

6 Citations (Scopus)

Abstract

In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

Original languageEnglish
Pages646-649
Number of pages4
Publication statusPublished - 2001 Dec 1
Event4th International Conference on ASIC Proceedings - Shanghai, China
Duration: 2001 Oct 232001 Oct 25

Conference

Conference4th International Conference on ASIC Proceedings
CountryChina
CityShanghai
Period01/10/2301/10/25

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Li, R., Hu, C., Yang, J., Zhang, Z., Shi, Y., & Shi, L. (2001). A new low power BIST methodology by altering the structure of linear feedback shift registers. 646-649. Paper presented at 4th International Conference on ASIC Proceedings, Shanghai, China.