A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra

K. Nishida, M. Osada, S. Wada, S. Okamoto, R. Ueno, H. Funakubo, T. Katoda

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

We have investigated polarized Raman spectra of epitaxial Pb(Zr x Ti 1-x )O 3 (PZT) thin films (x = 0.35) in which the volume ratio of the polar c -domains is systematically varied from 4 to 96% relative to the non-polar a -domains, and a new method using polarized Raman spectroscopy to characterize a relative volume of c -domain in a PZT film is proposed. This method depends on discovery that an intensity of A 1 (1TO) is proportional to the relative volume of c -domain. Polarized Raman spectroscopy is necessary to separate the peaks from A 1 (1TO) and B 1 modes to any other modes.

Original languageEnglish
Title of host publicationIntegrated Ferroelectrics
Pages281-287
Number of pages7
Volume78
Edition1
DOIs
Publication statusPublished - 2006 Nov 1
Externally publishedYes

Keywords

  • Domain distribution
  • PbZrTiO(PZT)
  • Raman scattering
  • Thin film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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    Nishida, K., Osada, M., Wada, S., Okamoto, S., Ueno, R., Funakubo, H., & Katoda, T. (2006). A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. In Integrated Ferroelectrics (1 ed., Vol. 78, pp. 281-287) https://doi.org/10.1080/10584580600663425