A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra

K. Nishida, M. Osada, S. Wada, S. Okamoto, R. Ueno, H. Funakubo, T. Katoda

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

We have investigated polarized Raman spectra of epitaxial Pb(Zr x Ti 1-x )O 3 (PZT) thin films (x = 0.35) in which the volume ratio of the polar c -domains is systematically varied from 4 to 96% relative to the non-polar a -domains, and a new method using polarized Raman spectroscopy to characterize a relative volume of c -domain in a PZT film is proposed. This method depends on discovery that an intensity of A 1 (1TO) is proportional to the relative volume of c -domain. Polarized Raman spectroscopy is necessary to separate the peaks from A 1 (1TO) and B 1 modes to any other modes.

Original languageEnglish
Title of host publicationIntegrated Ferroelectrics
Pages281-287
Number of pages7
Volume78
Edition1
DOIs
Publication statusPublished - 2006 Nov 1
Externally publishedYes

Fingerprint

Raman spectroscopy
Raman scattering
Raman spectra
Thin films
thin films

Keywords

  • Domain distribution
  • PbZrTiO(PZT)
  • Raman scattering
  • Thin film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Nishida, K., Osada, M., Wada, S., Okamoto, S., Ueno, R., Funakubo, H., & Katoda, T. (2006). A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. In Integrated Ferroelectrics (1 ed., Vol. 78, pp. 281-287) https://doi.org/10.1080/10584580600663425

A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. / Nishida, K.; Osada, M.; Wada, S.; Okamoto, S.; Ueno, R.; Funakubo, H.; Katoda, T.

Integrated Ferroelectrics. Vol. 78 1. ed. 2006. p. 281-287.

Research output: Chapter in Book/Report/Conference proceedingChapter

Nishida, K, Osada, M, Wada, S, Okamoto, S, Ueno, R, Funakubo, H & Katoda, T 2006, A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. in Integrated Ferroelectrics. 1 edn, vol. 78, pp. 281-287. https://doi.org/10.1080/10584580600663425
Nishida K, Osada M, Wada S, Okamoto S, Ueno R, Funakubo H et al. A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. In Integrated Ferroelectrics. 1 ed. Vol. 78. 2006. p. 281-287 https://doi.org/10.1080/10584580600663425
Nishida, K. ; Osada, M. ; Wada, S. ; Okamoto, S. ; Ueno, R. ; Funakubo, H. ; Katoda, T. / A new method to characterize a relative volume to the c-domain in PZT films based on Raman spectra. Integrated Ferroelectrics. Vol. 78 1. ed. 2006. pp. 281-287
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