A new multiscale line detection approach for aerial image with complex scene

Jing Wang, Takeshi Ikenaga, Satoshi Goto, Kazuo Kunieda, Makoto Iwata, Hirokazu Koizumi, Hideo Shimazu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Straight lines are important geometric features for aerial image understanding tasks like man-made object detection. As image scene becomes more complex, traditional method like Hough Transform may produce false detections and cannot work efficiently. In this paper, we propose a new multi-scale line detection approach that can efficiently detect semantic lines in aerial image with complex scene. Firstly, a method called "Trichotomy Line Extraction" detects reliable line segments locally. Then multi-scale image system is constructed by wavelet decomposition, from which global information is obtained to detect semantic lines. Experimental results show that proposed method can extract accurate linear features on complex scene aerial images in a robust and efficient way.

Original languageEnglish
Title of host publicationAPCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems
Pages1968-1971
Number of pages4
DOIs
Publication statusPublished - 2006 Dec 1
EventAPCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems - , Singapore
Duration: 2006 Dec 42006 Dec 6

Publication series

NameIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

ConferenceAPCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems
CountrySingapore
Period06/12/406/12/6

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Keywords

  • Man-made object detection
  • Multi-scale line detection
  • Straight line
  • Wavelet decomposition

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Wang, J., Ikenaga, T., Goto, S., Kunieda, K., Iwata, M., Koizumi, H., & Shimazu, H. (2006). A new multiscale line detection approach for aerial image with complex scene. In APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems (pp. 1968-1971). [4145804] (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS). https://doi.org/10.1109/APCCAS.2006.342247