A new self-test structure for at-speed test of crosstalk in SoC busses

Jun Yang*, Chen Hu, Youhua Shi, Zhe Zhang, Longxing Shi

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'A new self-test structure for at-speed test of crosstalk in SoC busses'. Together they form a unique fingerprint.

Engineering & Materials Science