A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness

S. Noguchi, Atsushi Ishiyama, H. Ueda

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    An extremely high field homogeneity is required for applications of NMR and MRI magnets.

    Original languageEnglish
    Title of host publication2017 IEEE International Magnetics Conference, INTERMAG 2017
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781538610862
    DOIs
    Publication statusPublished - 2017 Aug 10
    Event2017 IEEE International Magnetics Conference, INTERMAG 2017 - Dublin, Ireland
    Duration: 2017 Apr 242017 Apr 28

    Other

    Other2017 IEEE International Magnetics Conference, INTERMAG 2017
    CountryIreland
    CityDublin
    Period17/4/2417/4/28

    Fingerprint

    Magnetic resonance imaging
    Tapes
    tapes
    homogeneity
    Magnets
    Screening
    magnets
    screening
    Nuclear magnetic resonance
    nuclear magnetic resonance
    approximation
    simulation

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics

    Cite this

    Noguchi, S., Ishiyama, A., & Ueda, H. (2017). A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness. In 2017 IEEE International Magnetics Conference, INTERMAG 2017 [8007825] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2017.8007825

    A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness. / Noguchi, S.; Ishiyama, Atsushi; Ueda, H.

    2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 8007825.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Noguchi, S, Ishiyama, A & Ueda, H 2017, A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness. in 2017 IEEE International Magnetics Conference, INTERMAG 2017., 8007825, Institute of Electrical and Electronics Engineers Inc., 2017 IEEE International Magnetics Conference, INTERMAG 2017, Dublin, Ireland, 17/4/24. https://doi.org/10.1109/INTMAG.2017.8007825
    Noguchi S, Ishiyama A, Ueda H. A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness. In 2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc. 2017. 8007825 https://doi.org/10.1109/INTMAG.2017.8007825
    Noguchi, S. ; Ishiyama, Atsushi ; Ueda, H. / A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness. 2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc., 2017.
    @inproceedings{9c929bc7963949b2b0b7a245b38e6f4d,
    title = "A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness",
    abstract = "An extremely high field homogeneity is required for applications of NMR and MRI magnets.",
    author = "S. Noguchi and Atsushi Ishiyama and H. Ueda",
    year = "2017",
    month = "8",
    day = "10",
    doi = "10.1109/INTMAG.2017.8007825",
    language = "English",
    booktitle = "2017 IEEE International Magnetics Conference, INTERMAG 2017",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",

    }

    TY - GEN

    T1 - A new thin approximation simulation method of screening current in REBCO tape considering tape's thickness

    AU - Noguchi, S.

    AU - Ishiyama, Atsushi

    AU - Ueda, H.

    PY - 2017/8/10

    Y1 - 2017/8/10

    N2 - An extremely high field homogeneity is required for applications of NMR and MRI magnets.

    AB - An extremely high field homogeneity is required for applications of NMR and MRI magnets.

    UR - http://www.scopus.com/inward/record.url?scp=85034640237&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85034640237&partnerID=8YFLogxK

    U2 - 10.1109/INTMAG.2017.8007825

    DO - 10.1109/INTMAG.2017.8007825

    M3 - Conference contribution

    BT - 2017 IEEE International Magnetics Conference, INTERMAG 2017

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -