A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam

K. Terada, K. Ninomiya, T. Osawa, S. Tachibana, Y. Miyake, M. K. Kubo, N. Kawamura, W. Higemoto, A. Tsuchiyama, Mitsuru Ebihara, M. Uesugi

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The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (106'1 for a momentum of 60'MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis using 'capture. Controlling muon momentum from 32.5 to 57.5'MeV/c, we successfully demonstrate a depth-profile analysis of light elements (B, C, N, and O) from several mm-thick layered materials and non-destructive bulk analyses of meteorites containing organic materials. Muon beam analysis, enabling a bulk analysis of light to heavy elements without severe radioactivation, is a unique analytical method complementary to other non-destructive analyses. Furthermore, this technology can be used as a powerful tool to identify the content and distribution of organic components in future asteroidal return samples.

Original languageEnglish
Article number5072
JournalScientific Reports
Publication statusPublished - 2014 May 27
Externally publishedYes


ASJC Scopus subject areas

  • General

Cite this

Terada, K., Ninomiya, K., Osawa, T., Tachibana, S., Miyake, Y., Kubo, M. K., Kawamura, N., Higemoto, W., Tsuchiyama, A., Ebihara, M., & Uesugi, M. (2014). A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam. Scientific Reports, 4, [5072]. https://doi.org/10.1038/srep05072