A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for 3D-Networks-on-Chip

Khanh N. Dang*, Michael Conrad Meyer, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan Tu Tran

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds