A novel critical fault screening method using time domain equal-area criterion considering controllers

Kaoru Nakamura, Tomomi Sadakawa, Yukimasa Moriya, Shinichi Iwamoto, Yuichi Tobita, Kinya Abe

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Recently, in Japan, deregulation has resulted in a huge and complicated power system. In order to prevent massive blackouts in such a system, we must focus our attention on transient stability, in particular, time domain equal area criterion (TDEAC). First, we propose two indices for critical fault screening by TDEAC using the classical model as a generator model and we verify the validity of the proposed indices with simulations. Second, we propose TDEAC considering controllers (TDEACC) using a detailed model based on Park equations as a generator model and explain the differences in ranks between models. Finally, we apply the two proposed indices to TDEACC and verify the validity of the proposed indices for critical fault screening and reduction in simulation time.

    Original languageEnglish
    Title of host publicationProceedings of the 2016 IEEE Region 10 Conference, TENCON 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages3340-3343
    Number of pages4
    ISBN (Electronic)9781509025961
    DOIs
    Publication statusPublished - 2017 Feb 8
    Event2016 IEEE Region 10 Conference, TENCON 2016 - Singapore, Singapore
    Duration: 2016 Nov 222016 Nov 25

    Other

    Other2016 IEEE Region 10 Conference, TENCON 2016
    CountrySingapore
    CitySingapore
    Period16/11/2216/11/25

    Fingerprint

    Screening
    Controllers
    Deregulation

    Keywords

    • Controllers
    • Critical Clearing Time
    • Critical Fault Screening
    • Equal Area Criterion
    • Time Domain Equal Area Criterion
    • Transient Stability

    ASJC Scopus subject areas

    • Computer Science Applications
    • Electrical and Electronic Engineering

    Cite this

    Nakamura, K., Sadakawa, T., Moriya, Y., Iwamoto, S., Tobita, Y., & Abe, K. (2017). A novel critical fault screening method using time domain equal-area criterion considering controllers. In Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016 (pp. 3340-3343). [7848671] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2016.7848671

    A novel critical fault screening method using time domain equal-area criterion considering controllers. / Nakamura, Kaoru; Sadakawa, Tomomi; Moriya, Yukimasa; Iwamoto, Shinichi; Tobita, Yuichi; Abe, Kinya.

    Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016. Institute of Electrical and Electronics Engineers Inc., 2017. p. 3340-3343 7848671.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Nakamura, K, Sadakawa, T, Moriya, Y, Iwamoto, S, Tobita, Y & Abe, K 2017, A novel critical fault screening method using time domain equal-area criterion considering controllers. in Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016., 7848671, Institute of Electrical and Electronics Engineers Inc., pp. 3340-3343, 2016 IEEE Region 10 Conference, TENCON 2016, Singapore, Singapore, 16/11/22. https://doi.org/10.1109/TENCON.2016.7848671
    Nakamura K, Sadakawa T, Moriya Y, Iwamoto S, Tobita Y, Abe K. A novel critical fault screening method using time domain equal-area criterion considering controllers. In Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016. Institute of Electrical and Electronics Engineers Inc. 2017. p. 3340-3343. 7848671 https://doi.org/10.1109/TENCON.2016.7848671
    Nakamura, Kaoru ; Sadakawa, Tomomi ; Moriya, Yukimasa ; Iwamoto, Shinichi ; Tobita, Yuichi ; Abe, Kinya. / A novel critical fault screening method using time domain equal-area criterion considering controllers. Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 3340-3343
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