A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability

Yan Wu, Hiroyuki Hasegawa, Kuniyuki Kakushima, Kenji Ohmori, Takanobu Watanabe, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Yoshinori Kataoka, Kenji Natori, Keisaku Yamada, Hiroshi Iwai

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A new type of silicon-based Tunneling FET (TFET) using semiconducting silicide Mg2Si/Si hetero-junction as source-channel structure is proposed and the device simulation has been presented. With narrow bandgap of silicide and the conduction and valence band discontinuous at the hetero-junction, larger drain current and smaller subthreshold swing than those of Si homo-junction TFET can be obtained. Structural optimization study reveals that low Si channel impurity concentration and the alignment of the gate electrode edge to the hetero-junction lead to better performance of the TFET. Scaling of the gate length increases the off-state leakage current, however, the drain voltage (Vd) reduction in accordance with the gate scaling suppresses the phenomenon, keeping its high drivability.

Original languageEnglish
Pages (from-to)899-904
Number of pages6
JournalMicroelectronics Reliability
Volume54
Issue number5
DOIs
Publication statusPublished - 2014 May

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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    Wu, Y., Hasegawa, H., Kakushima, K., Ohmori, K., Watanabe, T., Nishiyama, A., Sugii, N., Wakabayashi, H., Tsutsui, K., Kataoka, Y., Natori, K., Yamada, K., & Iwai, H. (2014). A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability. Microelectronics Reliability, 54(5), 899-904. https://doi.org/10.1016/j.microrel.2014.01.023