Abstract
As an extension of the model of Toyoda, Kawahashi, and Matsushita (2005), the present authors added to the model the parameter f0, which represents individual differences in social desirability. In addition, we removed the assumption of tau-equivalent measurement for items. A paired-comparison test was constructed using competency scales developed in a pretest. The test was split into half, and the two halves standardized. The data from 400 participants indicated that split-half validity and reliability was confirmed. In a validity study, in order to examine the robustness of the standardized test to response biases, 199 participants took the paired-comparison test and a Likert test. Participants were instructed to assume that they were in a 2-selection evaluation scene. The results indicated that the new method is more robust to response biases than the Likert method, irrespective of differences in the evaluation scene.
| Original language | English |
|---|---|
| Pages (from-to) | 325-334 |
| Number of pages | 10 |
| Journal | Japanese Journal of Educational Psychology |
| Volume | 55 |
| Issue number | 3 |
| Publication status | Published - 2007 Sep |
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Keywords
- Paired comparison competency test
- Response biases
- Social desirability
- Structural equation modeling
ASJC Scopus subject areas
- Psychology(all)
- Developmental and Educational Psychology
Cite this
A paired comparison test model using structural equation modeling resistant to response bias. / Toyoda, Hideki; Kawahashi, Ikko; Watanabe, Tohru; Hidaka, Mieko.
In: Japanese Journal of Educational Psychology, Vol. 55, No. 3, 09.2007, p. 325-334.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - A paired comparison test model using structural equation modeling resistant to response bias
AU - Toyoda, Hideki
AU - Kawahashi, Ikko
AU - Watanabe, Tohru
AU - Hidaka, Mieko
PY - 2007/9
Y1 - 2007/9
N2 - As an extension of the model of Toyoda, Kawahashi, and Matsushita (2005), the present authors added to the model the parameter f0, which represents individual differences in social desirability. In addition, we removed the assumption of tau-equivalent measurement for items. A paired-comparison test was constructed using competency scales developed in a pretest. The test was split into half, and the two halves standardized. The data from 400 participants indicated that split-half validity and reliability was confirmed. In a validity study, in order to examine the robustness of the standardized test to response biases, 199 participants took the paired-comparison test and a Likert test. Participants were instructed to assume that they were in a 2-selection evaluation scene. The results indicated that the new method is more robust to response biases than the Likert method, irrespective of differences in the evaluation scene.
AB - As an extension of the model of Toyoda, Kawahashi, and Matsushita (2005), the present authors added to the model the parameter f0, which represents individual differences in social desirability. In addition, we removed the assumption of tau-equivalent measurement for items. A paired-comparison test was constructed using competency scales developed in a pretest. The test was split into half, and the two halves standardized. The data from 400 participants indicated that split-half validity and reliability was confirmed. In a validity study, in order to examine the robustness of the standardized test to response biases, 199 participants took the paired-comparison test and a Likert test. Participants were instructed to assume that they were in a 2-selection evaluation scene. The results indicated that the new method is more robust to response biases than the Likert method, irrespective of differences in the evaluation scene.
KW - Paired comparison competency test
KW - Response biases
KW - Social desirability
KW - Structural equation modeling
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UR - http://www.scopus.com/inward/citedby.url?scp=38149032813&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:38149032813
VL - 55
SP - 325
EP - 334
JO - Japanese Journal of Educational Psychology
JF - Japanese Journal of Educational Psychology
SN - 0021-5015
IS - 3
ER -