A pattern for reconstructing test code based on test coverage

Kazunori Sakamoto, Hironori Washizaki, Takuto Wada, Yoshiaki Fukazawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the patter.

Original languageEnglish
Title of host publicationAsianPLoP 2010 - 1st Asian Conference on Pattern Languages of Programs, Proceedings
DOIs
Publication statusPublished - 2010 Dec 1
Event1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010 - Tokyo, Japan
Duration: 2010 Mar 162010 Mar 17

Publication series

NameACM International Conference Proceeding Series

Conference

Conference1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010
CountryJapan
CityTokyo
Period10/3/1610/3/17

    Fingerprint

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

Cite this

Sakamoto, K., Washizaki, H., Wada, T., & Fukazawa, Y. (2010). A pattern for reconstructing test code based on test coverage. In AsianPLoP 2010 - 1st Asian Conference on Pattern Languages of Programs, Proceedings (ACM International Conference Proceeding Series). https://doi.org/10.1145/2371736.2371758