A pattern for reconstructing test code based on test coverage

Kazunori Sakamoto, Hironori Washizaki, Takuto Wada, Yoshiaki Fukazawa

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the patter.

    Original languageEnglish
    Title of host publicationACM International Conference Proceeding Series
    DOIs
    Publication statusPublished - 2010
    Event1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010 - Tokyo
    Duration: 2010 Mar 162010 Mar 17

    Other

    Other1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010
    CityTokyo
    Period10/3/1610/3/17

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    Maintainability

    ASJC Scopus subject areas

    • Human-Computer Interaction
    • Computer Networks and Communications
    • Computer Vision and Pattern Recognition
    • Software

    Cite this

    A pattern for reconstructing test code based on test coverage. / Sakamoto, Kazunori; Washizaki, Hironori; Wada, Takuto; Fukazawa, Yoshiaki.

    ACM International Conference Proceeding Series. 2010.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Sakamoto, K, Washizaki, H, Wada, T & Fukazawa, Y 2010, A pattern for reconstructing test code based on test coverage. in ACM International Conference Proceeding Series. 1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010, Tokyo, 10/3/16. https://doi.org/10.1145/2371736.2371758
    Sakamoto, Kazunori ; Washizaki, Hironori ; Wada, Takuto ; Fukazawa, Yoshiaki. / A pattern for reconstructing test code based on test coverage. ACM International Conference Proceeding Series. 2010.
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