A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements

Uijin G. Jung, Kenta Kuwana, Yoshiharu Ajiki, Hidetoshi Takahashi, Tetsuo Kan, Yusuke Takei, Kentaro Noda, Eiji Iwase, Kiyoshi Matsumoto, Isao Shimoyama

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

    Original languageEnglish
    Article number045015
    JournalJournal of Micromechanics and Microengineering
    Volume23
    Issue number4
    DOIs
    Publication statusPublished - 2013 Apr

    Fingerprint

    Force measurement
    Photoelectricity
    Acoustic impedance
    Microscopes
    Fluorescence
    Irradiation
    Wavelength
    Compensation and Redress

    ASJC Scopus subject areas

    • Mechanical Engineering
    • Electrical and Electronic Engineering
    • Mechanics of Materials
    • Electronic, Optical and Magnetic Materials

    Cite this

    A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements. / Jung, Uijin G.; Kuwana, Kenta; Ajiki, Yoshiharu; Takahashi, Hidetoshi; Kan, Tetsuo; Takei, Yusuke; Noda, Kentaro; Iwase, Eiji; Matsumoto, Kiyoshi; Shimoyama, Isao.

    In: Journal of Micromechanics and Microengineering, Vol. 23, No. 4, 045015, 04.2013.

    Research output: Contribution to journalArticle

    Jung, UG, Kuwana, K, Ajiki, Y, Takahashi, H, Kan, T, Takei, Y, Noda, K, Iwase, E, Matsumoto, K & Shimoyama, I 2013, 'A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements', Journal of Micromechanics and Microengineering, vol. 23, no. 4, 045015. https://doi.org/10.1088/0960-1317/23/4/045015
    Jung, Uijin G. ; Kuwana, Kenta ; Ajiki, Yoshiharu ; Takahashi, Hidetoshi ; Kan, Tetsuo ; Takei, Yusuke ; Noda, Kentaro ; Iwase, Eiji ; Matsumoto, Kiyoshi ; Shimoyama, Isao. / A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements. In: Journal of Micromechanics and Microengineering. 2013 ; Vol. 23, No. 4.
    @article{c0b94003a16341f6aad9de70f7425877,
    title = "A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements",
    abstract = "This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87{\%}.",
    author = "Jung, {Uijin G.} and Kenta Kuwana and Yoshiharu Ajiki and Hidetoshi Takahashi and Tetsuo Kan and Yusuke Takei and Kentaro Noda and Eiji Iwase and Kiyoshi Matsumoto and Isao Shimoyama",
    year = "2013",
    month = "4",
    doi = "10.1088/0960-1317/23/4/045015",
    language = "English",
    volume = "23",
    journal = "Journal of Micromechanics and Microengineering",
    issn = "0960-1317",
    publisher = "IOP Publishing Ltd.",
    number = "4",

    }

    TY - JOUR

    T1 - A photoresponse-compensated parallel piezoresistive cantilever for cellular force measurements

    AU - Jung, Uijin G.

    AU - Kuwana, Kenta

    AU - Ajiki, Yoshiharu

    AU - Takahashi, Hidetoshi

    AU - Kan, Tetsuo

    AU - Takei, Yusuke

    AU - Noda, Kentaro

    AU - Iwase, Eiji

    AU - Matsumoto, Kiyoshi

    AU - Shimoyama, Isao

    PY - 2013/4

    Y1 - 2013/4

    N2 - This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

    AB - This paper describes a parallel piezoresistive cantilever that is composed of a force-sensing cantilever in addition to a reference cantilever for photoresponse compensation. Piezoresistive cantilevers have been applied in many cellular mechanical measurement studies because of their high sensitivity, high time resolution and ease of handling. However, the electrical resistance changes in response to the excitation light of the fluorescence microscope, which affects the cell measurements. We measured the I-V characteristics of a piezoresistive layer. These photoresponses occurred due to the internal photoelectric effect. We canceled the photoresponses using the reference cantilever. This paper demonstrates compensation of the cantilever photoresponse under irradiation at different angles, wavelengths and light intensities. As a result, the photoresponse could be decreased by 87%.

    UR - http://www.scopus.com/inward/record.url?scp=84878092600&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84878092600&partnerID=8YFLogxK

    U2 - 10.1088/0960-1317/23/4/045015

    DO - 10.1088/0960-1317/23/4/045015

    M3 - Article

    VL - 23

    JO - Journal of Micromechanics and Microengineering

    JF - Journal of Micromechanics and Microengineering

    SN - 0960-1317

    IS - 4

    M1 - 045015

    ER -