A reliable complex power flow calculation based on bus current equations

Aya Fujiwara, Miki Ichihara, Sho Yamanouchi, Shinichi Iwamoto

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    It is important to know the power system condition by calculating power flows. As an alternative to the Newton-Raphson method which requires much calculation and complex program, this paper proposes a highly reliable complex power flow calculation method that requires not Jacobian matrix but the I=YE equation. To consider the proposed method, two approaches were tested. Simulations are carried out to determine which approach is suitable for the proposed method and a reliable and fast power flow calculation technique was developed. In addition, the proposed method is applied to circuit calculations for transient stability calculations, which use the I=YE equation. Simulations were run to verify the validity of the proposed method.

    Original languageEnglish
    Title of host publicationProceedings of the 2016 IEEE Region 10 Conference, TENCON 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages3336-3339
    Number of pages4
    ISBN (Electronic)9781509025961
    DOIs
    Publication statusPublished - 2017 Feb 8
    Event2016 IEEE Region 10 Conference, TENCON 2016 - Singapore, Singapore
    Duration: 2016 Nov 222016 Nov 25

    Other

    Other2016 IEEE Region 10 Conference, TENCON 2016
    CountrySingapore
    CitySingapore
    Period16/11/2216/11/25

    Keywords

    • Complex Number
    • Optimal Multiplier
    • Power Flow Calculation
    • Power System
    • Transient Stability

    ASJC Scopus subject areas

    • Computer Science Applications
    • Electrical and Electronic Engineering

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  • Cite this

    Fujiwara, A., Ichihara, M., Yamanouchi, S., & Iwamoto, S. (2017). A reliable complex power flow calculation based on bus current equations. In Proceedings of the 2016 IEEE Region 10 Conference, TENCON 2016 (pp. 3336-3339). [7848670] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2016.7848670