A secure test technique for pipelined advanced encryption standard

Youhua Shi; Nozomu Togawa; Masao Yanagisawa; Tatsuo Ohtsuki

doi:10.1093/ietisy/e91-d.3.776

A secure test technique for pipelined advanced encryption standard

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

Original language	English
Pages (from-to)	776-780
Number of pages	5
Journal	IEICE Transactions on Information and Systems
Volume	E91-D
Issue number	3
DOIs	https://doi.org/10.1093/ietisy/e91-d.3.776
Publication status	Published - 2008 Mar

Keywords

Scan test
Security
Test quality

ASJC Scopus subject areas

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

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Cite this

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