A secure test technique for pipelined advanced encryption standard

Youhua Shi; Nozomu Togawa; Masao Yanagisawa; Tatsuo Ohtsuki

doi:10.1093/ietisy/e91-d.3.776

A secure test technique for pipelined advanced encryption standard

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article

3 Citations (Scopus)

Abstract

In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

Original language	English
Pages (from-to)	776-780
Number of pages	5
Journal	IEICE Transactions on Information and Systems
Volume	E91-D
Issue number	3
DOIs	https://doi.org/10.1093/ietisy/e91-d.3.776
Publication status	Published - 2008 Mar

Keywords

Scan test
Security
Test quality

ASJC Scopus subject areas

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

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Cite this

Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). A secure test technique for pipelined advanced encryption standard. IEICE Transactions on Information and Systems, E91-D(3), 776-780. https://doi.org/10.1093/ietisy/e91-d.3.776

@article{5149b8b18d8646d1a91e8df0012f4b8a,

title = "A secure test technique for pipelined advanced encryption standard",

abstract = "In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.",

keywords = "Scan test, Security, Test quality",

author = "Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",

year = "2008",

month = mar,

doi = "10.1093/ietisy/e91-d.3.776",

language = "English",

volume = "E91-D",

pages = "776--780",

journal = "IEICE Transactions on Information and Systems",

issn = "0916-8532",

publisher = "Maruzen Co., Ltd/Maruzen Kabushikikaisha",

number = "3",

}

TY - JOUR

T1 - A secure test technique for pipelined advanced encryption standard

AU - Shi, Youhua

AU - Togawa, Nozomu

AU - Yanagisawa, Masao

AU - Ohtsuki, Tatsuo

PY - 2008/3

Y1 - 2008/3

N2 - In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

AB - In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

KW - Scan test

KW - Security

KW - Test quality

UR - http://www.scopus.com/inward/record.url?scp=68149158867&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=68149158867&partnerID=8YFLogxK

U2 - 10.1093/ietisy/e91-d.3.776

DO - 10.1093/ietisy/e91-d.3.776

M3 - Article

AN - SCOPUS:68149158867

VL - E91-D

SP - 776

EP - 780

JO - IEICE Transactions on Information and Systems

JF - IEICE Transactions on Information and Systems

SN - 0916-8532

IS - 3

ER -