In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.
- Scan test
- Test quality
ASJC Scopus subject areas
- Hardware and Architecture
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering
- Artificial Intelligence