A selective scan chain reconfiguration through run-length coding for test data compression and scan power reduction

Youhua Shi*, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'A selective scan chain reconfiguration through run-length coding for test data compression and scan power reduction'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science