Abstract
We successfully prepared both positive- and negative-tone patterns by applying poly(methyl methacrylate) (PMMA) as a photoresist. A positive-pattern was prepared by lithography through a photomask using 172 nm vacuum ultraviolet (VUV) light under the pressure of 103 Pa. A negative-pattern was prepared using the same VUV light under the reduced pressure of 10 Pa, followed by rinsing with toluene solution. At 103 Pa, the irradiated PMMA was effectively decomposed and eliminated. On the other hand, at 10 Pa, the irradiated PMMA became cured and resistant to etching. We subsequently utilized these positive- and negative-tone patterns as templates on indium-tin-oxide surfaces to electrodeposit copper microstructures with 10 μm lines and spaces.
Original language | English |
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Pages (from-to) | 237-240 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 500 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 2006 Apr 3 |
Keywords
- Atomic force microscopy
- Photoresist
- Poly(methyl)methacrylate
- Vacuum ultraviolet
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry