A simulation of deep dielectric charging induced by dielectric temperature and energetic electrons

Shengtao Li, Daomin Min, Min Lin, Weiwei Li, Jianying Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, a computer numerical simulation of one-dimensional deep dielectric charging (DDC) of spacecrafts induced by temperature and energetic electrons has been developed. It provides a method for spacecraft engineers to analyze the phenomena of DDC in spacecrafts and then to predict whether or when electrostatic discharging (ESD) will occur. The simulation code is developed to analyze the influence of different magnitude of dielectric temperature and energetic electrons flux on deep dielectric charging/discharging occurrence. In the simulation, we find that there exists an ESD inception energetic electron flux threshold. The flux threshold decreases with the decrease of dielectric temperature. It is interesting that there exists a critical dielectric temperature (250 K for low-density polyethylene) in the DDC process. Below the critical temperature or above that, respectively, the energetic electron flux and the dielectric temperature are the dominated influencing factors in the DDC process. Then, considering the DDC electric field and the charging time, we present a rough prediction of discharging occurrence probability with varied flux of energetic electrons and dielectric temperature.

Original languageEnglish
Title of host publicationProceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam, Germany
Duration: 2010 Jul 42010 Jul 9

Other

Other2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
CountryGermany
CityPotsdam
Period10/7/410/7/9

Keywords

  • Conductiviyt
  • Deep dielectric charging (DDC)
  • Electrostatic discharging (ESD)
  • Energetic electron environmen
  • Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Li, S., Min, D., Lin, M., Li, W., & Li, J. (2010). A simulation of deep dielectric charging induced by dielectric temperature and energetic electrons. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 [5568065] https://doi.org/10.1109/ICSD.2010.5568065