A study of capture-safe test generation flow for at-speed testing

Kohei Miyase*, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja

*Corresponding author for this work

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Mathematics

Engineering & Materials Science