A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed

Lan Zhang, Atsushi Hosoi, Yang Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

Original languageEnglish
Title of host publicationMaterials Science Forum
Pages200-203
Number of pages4
Volume750
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City
Duration: 2012 Aug 12012 Aug 4

Publication series

NameMaterials Science Forum
Volume750
ISSN (Print)02555476

Other

Other8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
CityFukuoka City
Period12/8/112/8/4

Fingerprint

spatial resolution
Microwaves
Scanning
Imaging techniques
microwaves
scanning
Microscopes
Microwave measurement
microscopes
Time measurement
Topography
Nanowires
topography
nanowires
Glass
time measurement
wafers
glass

Keywords

  • Atomic force microscope
  • Electrical property
  • Microwave
  • Nano-structural probe

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Zhang, L., Hosoi, A., & Ju, Y. (2013). A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. In Materials Science Forum (Vol. 750, pp. 200-203). (Materials Science Forum; Vol. 750). https://doi.org/10.4028/www.scientific.net/MSF.750.200

A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. / Zhang, Lan; Hosoi, Atsushi; Ju, Yang.

Materials Science Forum. Vol. 750 2013. p. 200-203 (Materials Science Forum; Vol. 750).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, L, Hosoi, A & Ju, Y 2013, A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. in Materials Science Forum. vol. 750, Materials Science Forum, vol. 750, pp. 200-203, 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012, Fukuoka City, 12/8/1. https://doi.org/10.4028/www.scientific.net/MSF.750.200
Zhang, Lan ; Hosoi, Atsushi ; Ju, Yang. / A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. Materials Science Forum. Vol. 750 2013. pp. 200-203 (Materials Science Forum).
@inproceedings{0d9f98e58d8c4f80a77f7ecfbfa9a9f1,
title = "A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed",
abstract = "Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.",
keywords = "Atomic force microscope, Electrical property, Microwave, Nano-structural probe",
author = "Lan Zhang and Atsushi Hosoi and Yang Ju",
year = "2013",
doi = "10.4028/www.scientific.net/MSF.750.200",
language = "English",
isbn = "9783037856604",
volume = "750",
series = "Materials Science Forum",
pages = "200--203",
booktitle = "Materials Science Forum",

}

TY - GEN

T1 - A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed

AU - Zhang, Lan

AU - Hosoi, Atsushi

AU - Ju, Yang

PY - 2013

Y1 - 2013

N2 - Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

AB - Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

KW - Atomic force microscope

KW - Electrical property

KW - Microwave

KW - Nano-structural probe

UR - http://www.scopus.com/inward/record.url?scp=84875864278&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875864278&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.750.200

DO - 10.4028/www.scientific.net/MSF.750.200

M3 - Conference contribution

SN - 9783037856604

VL - 750

T3 - Materials Science Forum

SP - 200

EP - 203

BT - Materials Science Forum

ER -