A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed

Lan Zhang, Atsushi Hosoi, Yang Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

Original languageEnglish
Title of host publicationAdvanced Materials Science and Technology
PublisherTrans Tech Publications Ltd
Pages200-203
Number of pages4
ISBN (Print)9783037856604
DOIs
Publication statusPublished - 2013 Jan 1
Externally publishedYes
Event8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
Duration: 2012 Aug 12012 Aug 4

Publication series

NameMaterials Science Forum
Volume750
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
CountryJapan
CityFukuoka City
Period12/8/112/8/4

Keywords

  • Atomic force microscope
  • Electrical property
  • Microwave
  • Nano-structural probe

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Zhang, L., Hosoi, A., & Ju, Y. (2013). A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. In Advanced Materials Science and Technology (pp. 200-203). (Materials Science Forum; Vol. 750). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.750.200