A unified test compression technique for scan stimulus and unknown masking data with no test loss

    Research output: Contribution to journalArticle

    Abstract

    This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either Is or Os) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = [10g2 N + 2- In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.

    Original languageEnglish
    Pages (from-to)3514-3523
    Number of pages10
    JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
    VolumeE91-A
    Issue number12
    DOIs
    Publication statusPublished - 2008

    Fingerprint

    Masking
    Cost reduction
    Masks
    Compression
    Unknown
    Networks (circuits)
    Test Generation
    Slice
    Mask
    Manufacturing
    Benchmark
    Internal
    Costs
    Experimental Results

    Keywords

    • Scan test
    • Test data compression
    • X-masking

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Graphics and Computer-Aided Design
    • Applied Mathematics
    • Signal Processing

    Cite this

    @article{69d8737a12c447c1936968da6e9e3bcb,
    title = "A unified test compression technique for scan stimulus and unknown masking data with no test loss",
    abstract = "This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either Is or Os) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = [10g2 N + 2- In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.",
    keywords = "Scan test, Test data compression, X-masking",
    author = "Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",
    year = "2008",
    doi = "10.1093/ietfec/e91-a.12.3514",
    language = "English",
    volume = "E91-A",
    pages = "3514--3523",
    journal = "IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences",
    issn = "0916-8508",
    publisher = "Maruzen Co., Ltd/Maruzen Kabushikikaisha",
    number = "12",

    }

    TY - JOUR

    T1 - A unified test compression technique for scan stimulus and unknown masking data with no test loss

    AU - Shi, Youhua

    AU - Togawa, Nozomu

    AU - Yanagisawa, Masao

    AU - Ohtsuki, Tatsuo

    PY - 2008

    Y1 - 2008

    N2 - This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either Is or Os) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = [10g2 N + 2- In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.

    AB - This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for high quality manufacturing test cost reduction. Unlike prior test compression methods, the proposed approach considers the unknown responses during test pattern generation procedure, and then selectively encodes the less specified bits (either Is or Os) in each scan slice for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed test scheme could dramatically reduce test data volume as well as the number of required test channels by using only c tester channels to drive N internal scan chains, where c = [10g2 N + 2- In addition, because all the unknown responses could be exactly masked before entering into the response compactor, test loss due to unknown responses would be eliminated. Experimental results on both benchmark circuits and larger designs indicated the effectiveness of the proposed technique.

    KW - Scan test

    KW - Test data compression

    KW - X-masking

    UR - http://www.scopus.com/inward/record.url?scp=77951292795&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77951292795&partnerID=8YFLogxK

    U2 - 10.1093/ietfec/e91-a.12.3514

    DO - 10.1093/ietfec/e91-a.12.3514

    M3 - Article

    VL - E91-A

    SP - 3514

    EP - 3523

    JO - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

    JF - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

    SN - 0916-8508

    IS - 12

    ER -