ACCELERATED LASER SPECKLE STRAIN GAUGE.

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

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15 Citations (Scopus)

Abstract

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.

Original languageEnglish
Pages (from-to)671-676
Number of pages6
JournalOptical Engineering
Volume25
Issue number5
Publication statusPublished - 1986 May
Externally publishedYes

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Yamaguchi, I., Furukawa, T., Ueda, T., & Ogita, E. (1986). ACCELERATED LASER SPECKLE STRAIN GAUGE. Optical Engineering, 25(5), 671-676.