ACCELERATED LASER SPECKLE STRAIN GAUGE.

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.

Original languageEnglish
Pages (from-to)671-676
Number of pages6
JournalOptical Engineering
Volume25
Issue number5
Publication statusPublished - 1986 May
Externally publishedYes

Fingerprint

strain gages
Speckle
Strain gages
Lasers
lasers
high polymers
spatial filtering
strain measurement
microcomputers
detectors
Poisson ratio
electric potential
Detectors
photometers
Strain measurement
Electric potential
Photodetectors
Polymer films
Image sensors
Microcomputers

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Yamaguchi, I., Furukawa, T., Ueda, T., & Ogita, E. (1986). ACCELERATED LASER SPECKLE STRAIN GAUGE. Optical Engineering, 25(5), 671-676.

ACCELERATED LASER SPECKLE STRAIN GAUGE. / Yamaguchi, Ichirou; Furukawa, Takeo; Ueda, Toshitsugu; Ogita, Eiji.

In: Optical Engineering, Vol. 25, No. 5, 05.1986, p. 671-676.

Research output: Contribution to journalArticle

Yamaguchi, I, Furukawa, T, Ueda, T & Ogita, E 1986, 'ACCELERATED LASER SPECKLE STRAIN GAUGE.', Optical Engineering, vol. 25, no. 5, pp. 671-676.
Yamaguchi I, Furukawa T, Ueda T, Ogita E. ACCELERATED LASER SPECKLE STRAIN GAUGE. Optical Engineering. 1986 May;25(5):671-676.
Yamaguchi, Ichirou ; Furukawa, Takeo ; Ueda, Toshitsugu ; Ogita, Eiji. / ACCELERATED LASER SPECKLE STRAIN GAUGE. In: Optical Engineering. 1986 ; Vol. 25, No. 5. pp. 671-676.
@article{2c05164445f44334b86a4cfabb15a3bf,
title = "ACCELERATED LASER SPECKLE STRAIN GAUGE.",
abstract = "An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.",
author = "Ichirou Yamaguchi and Takeo Furukawa and Toshitsugu Ueda and Eiji Ogita",
year = "1986",
month = "5",
language = "English",
volume = "25",
pages = "671--676",
journal = "Optical Engineering",
issn = "0091-3286",
publisher = "SPIE",
number = "5",

}

TY - JOUR

T1 - ACCELERATED LASER SPECKLE STRAIN GAUGE.

AU - Yamaguchi, Ichirou

AU - Furukawa, Takeo

AU - Ueda, Toshitsugu

AU - Ogita, Eiji

PY - 1986/5

Y1 - 1986/5

N2 - An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.

AB - An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.

UR - http://www.scopus.com/inward/record.url?scp=0022709587&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022709587&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0022709587

VL - 25

SP - 671

EP - 676

JO - Optical Engineering

JF - Optical Engineering

SN - 0091-3286

IS - 5

ER -