ACCELERATED LASER-SPECKLE STRAIN GAUGE.

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsHenri H. Arsenault
Place of PublicationBellingham, WA, USA
PublisherSPIE
Pages132-138
Number of pages7
Volume556
ISBN (Print)0892525916
Publication statusPublished - 1985
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Yamaguchi, I., Furukawa, T., Ueda, T., & Ogita, E. (1985). ACCELERATED LASER-SPECKLE STRAIN GAUGE. In H. H. Arsenault (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 556, pp. 132-138). SPIE.