Acoustic-Wave Velocities and Refractive Indices in an m-Plane GaN Single-Crystal Plate and c-Axis-Oriented ScAlN Films Measured by Brillouin Scattering Techniques

Hayato Ichihashi, Takahiko Yanagitani, Masashi Suzuki, Shinji Takayanagi, Masahiko Kawabe, Shota Tomita, Mami Matsukawa

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    3 Citations (Scopus)


    We have experimentally investigated wave velocities and refractive indices in bulk and film samples [a GaN single-crystal plate and c-axis-oriented ScxAl(1-x)N (x= 0.00-0.63) films] by Brillouin scattering (BRS). All of the piezoelectrically unstiffened elastic constants and the ordinary refractive index of the GaN single-crystal plate were determined from the reflection-induced θA(RIθA) scattering geometry and the combination of 90R and 180° scattering geometries. The uncertainties of the measured wave velocities were approximately 0.17% (RIθA) and 2.5% (combination technique). In addition, the longitudinal-wave velocities of ScxAl(1-x)N films propagating in the normal direction were obtained by the combination technique. The maximum uncertainty was approximately 3.3%. The shear-wave velocities and refractive indices of ScxAl(1-x)N films were also investigated by the 90R scattering geometry using velocities measured by high-overtone bulk acoustic resonators. The softening trends of the elasticity were obtained from the measured longitudinal- and shear-wave velocities, although there were large uncertainties in the Brillouin measurement system owing to thermal instability.

    Original languageEnglish
    Article number7438921
    Pages (from-to)117-125
    Number of pages9
    JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
    Issue number5
    Publication statusPublished - 2016 May 1



    • Brillouin scattering (BRS) method
    • GaN single crystal
    • ScAlN film

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Acoustics and Ultrasonics
    • Instrumentation

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