Acquiring curvature-dependent reflectance function from translucent material

Midori Okamoto, Hiroyuki Kubo, Yasuhiro Mukaigawa, Tadahiro Ozawa, Keisuke Mochida, Shigeo Morishima

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Acquiring scattering parameters from real objects is still a challenging work. To obtain the scattering parameters, physics-based analysis is ineffective because huge computational cost is required to simulate subsurface scattering effect accurately. Thus, we focus on Curvature-Dependent Reflectance Function (CDRF), the plausible approximation of the subsurface scattering effect. In this paper, we propose a novel technique to obtain scattering parameters from real objects by revealing the relation between curvature and translucency.

    Original languageEnglish
    Title of host publicationProceedings - NICOGRAPH International 2016, NicoInt 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages182-185
    Number of pages4
    ISBN (Electronic)9781509023059
    DOIs
    Publication statusPublished - 2016 Sep 9
    Event15th NICOGRAPH International, NicoInt 2016 - Hangzhou, Zhejiang, China
    Duration: 2016 Jul 62016 Jul 8

    Other

    Other15th NICOGRAPH International, NicoInt 2016
    CountryChina
    CityHangzhou, Zhejiang
    Period16/7/616/7/8

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    Keywords

    • BRDF
    • Curvature
    • Inverse rendering
    • Subsurface scattering

    ASJC Scopus subject areas

    • Signal Processing
    • Media Technology
    • Computer Graphics and Computer-Aided Design

    Cite this

    Okamoto, M., Kubo, H., Mukaigawa, Y., Ozawa, T., Mochida, K., & Morishima, S. (2016). Acquiring curvature-dependent reflectance function from translucent material. In Proceedings - NICOGRAPH International 2016, NicoInt 2016 (pp. 182-185). [7564088] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NicoInt.2016.52