Acquiring curvature-dependent reflectance function from translucent material

Midori Okamoto, Hiroyuki Kubo, Yasuhiro Mukaigawa, Tadahiro Ozawa, Keisuke Mochida, Shigeo Morishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Acquiring scattering parameters from real objects is still a challenging work. To obtain the scattering parameters, physics-based analysis is ineffective because huge computational cost is required to simulate subsurface scattering effect accurately. Thus, we focus on Curvature-Dependent Reflectance Function (CDRF), the plausible approximation of the subsurface scattering effect. In this paper, we propose a novel technique to obtain scattering parameters from real objects by revealing the relation between curvature and translucency.

Original languageEnglish
Title of host publicationProceedings - NICOGRAPH International 2016, NicoInt 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages182-185
Number of pages4
ISBN (Electronic)9781509023059
DOIs
Publication statusPublished - 2016 Sep 9
Event15th NICOGRAPH International, NicoInt 2016 - Hangzhou, Zhejiang, China
Duration: 2016 Jul 62016 Jul 8

Publication series

NameProceedings - NICOGRAPH International 2016, NicoInt 2016

Other

Other15th NICOGRAPH International, NicoInt 2016
CountryChina
CityHangzhou, Zhejiang
Period16/7/616/7/8

Keywords

  • BRDF
  • Curvature
  • Inverse rendering
  • Subsurface scattering

ASJC Scopus subject areas

  • Signal Processing
  • Media Technology
  • Computer Graphics and Computer-Aided Design

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