AFM Tip Characterizer fabricated by Si/SiO2 multilayers

Hisataka Takenaka, Masatoshi Hatayama, Hisashi Ito, Tadayuki Ohchi, Akio Takano, Satoru Kurosawa, Hiroshi Itoh, Shingo Ichimura

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Chemical Compounds

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Physics & Astronomy