Alternative run-length coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce both test data volume and scan-in power consumption. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. To extract the compatible scan cells we apply a heuristic algorithm by solving the graph coloring problem; and then a simple greedy algorithm is used to configure the scan chain for the minimization of scan power. Experimental results for the larger IS-CAS'89 benchmarks show that the proposed approach leads to highly reduced test data volume with significant power savings during scan test.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
Pages432-437
Number of pages6
DOIs
Publication statusPublished - 2004
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting
Duration: 2004 Nov 152004 Nov 17

Other

OtherProceedings of the Asian Test Symposium, ATS'04
CityKenting
Period04/11/1504/11/17

Fingerprint

Coloring
Heuristic algorithms
Electric power utilization
System-on-chip

ASJC Scopus subject areas

  • Media Technology
  • Hardware and Architecture

Cite this

Alternative run-length coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test. / Shi, Youhua; Kimura, Shinji; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

Proceedings of the Asian Test Symposium. 2004. p. 432-437.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shi, Y, Kimura, S, Togawa, N, Yanagisawa, M & Ohtsuki, T 2004, Alternative run-length coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test. in Proceedings of the Asian Test Symposium. pp. 432-437, Proceedings of the Asian Test Symposium, ATS'04, Kenting, 04/11/15. https://doi.org/10.1109/ATS.2004.21
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