Alternative run-length coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce both test data volume and scan-in power consumption. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. To extract the compatible scan cells we apply a heuristic algorithm by solving the graph coloring problem; and then a simple greedy algorithm is used to configure the scan chain for the minimization of scan power. Experimental results for the larger IS-CAS'89 benchmarks show that the proposed approach leads to highly reduced test data volume with significant power savings during scan test.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium, ATS'04
Pages432-437
Number of pages6
DOIs
Publication statusPublished - 2004 Dec 1
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan, Province of China
Duration: 2004 Nov 152004 Nov 17

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Conference

ConferenceProceedings of the Asian Test Symposium, ATS'04
CountryTaiwan, Province of China
CityKenting
Period04/11/1504/11/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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