An advanced model for calculating the effective capacitance considering input waveform effect

Minglu Jiang, Zhangcai Huang, Atsushi Kurokawa, Yasuaki Inoue

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    In deep submicron designs, predicting gate delays is a noteworthy work for Static Timing Analysis (STA). The effective capacitance Ceff concept is usually used to calculate the gate delay of interconnect load. Conventionally, the input-signal is assumed as ramp waveform. However, the input waveform is also the output of CMOS gates with interconnect wires. Thus the simple assumption as a ramp signal results in significant influence on the delay calculating. In this paper, an advanced effective capacitance model is proposed to consider both the input waveform effect and interconnect wire load, where the nonlinear influence of input waveform is modeled as one part of effective capacitance of capacitive load to compute the gate delay. Experimental results show a significant improvement in accuracy when the input waveform effect is considered.

    Original languageEnglish
    Title of host publication2008 International Conference on Communications, Circuits and Systems Proceedings, ICCCAS 2008
    Pages1088-1092
    Number of pages5
    DOIs
    Publication statusPublished - 2008
    Event2008 International Conference on Communications, Circuits and Systems, ICCCAS 2008 - Xiamen, Fujian Province
    Duration: 2008 May 252008 May 27

    Other

    Other2008 International Conference on Communications, Circuits and Systems, ICCCAS 2008
    CityXiamen, Fujian Province
    Period08/5/2508/5/27

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    ASJC Scopus subject areas

    • Computer Networks and Communications
    • Hardware and Architecture
    • Control and Systems Engineering
    • Electrical and Electronic Engineering

    Cite this

    Jiang, M., Huang, Z., Kurokawa, A., & Inoue, Y. (2008). An advanced model for calculating the effective capacitance considering input waveform effect. In 2008 International Conference on Communications, Circuits and Systems Proceedings, ICCCAS 2008 (pp. 1088-1092). [4657957] https://doi.org/10.1109/ICCCAS.2008.4657957