An analytical model of the overshooting effect for multiple-input gates in nanometer technologies

Li Ding, Jing Wang, Zhangcai Huang, Atsushi Kurokawa, Yasuaki Inoue

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Fingerprint

    Dive into the research topics of 'An analytical model of the overshooting effect for multiple-input gates in nanometer technologies'. Together they form a unique fingerprint.

    Engineering & Materials Science