An artificial fingerprint device (AFD) module using poly-si thin film transistors with logic LSI compatible process for built-in security

S. Maeda, H. Kuriyama, T. Ipposhi, S. Maegawa, M. Inuishi

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

An artificial fingerprint device module using poly-crystalline silicon thin film transistors with logic LSI compatible process is proposed for securing a digital society. Substituting for actual fingerprint, characteristics variation of poly-silicon thin film transistors is utilized. The variation is random and offers unique, non-alterable, and non-duplicable numbers. Stable recognition operation based on the nature of poly-silicon TFTs is suggested.

Original languageEnglish
Pages (from-to)759-762
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting
Publication statusPublished - 2001 Dec 1
Externally publishedYes
EventIEEE International Electron Devices Meeting IEDM 2001 - Washington, DC, United States
Duration: 2001 Dec 22001 Dec 5

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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