An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit

Xingyu Wang, Hongjie Liu, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a small-area low-power inverter-based true random number generator (I-TRNG) which harvests entropy from thermal noise. A single CMOS inverter is used for noise amplification. Clock-feedthrough (CLFT) compensation and body-bias technique provide robustness across a wide range of supply voltage 0.7~1.0 V and temperature -40~100 °C. An on-chip 4-bit Von-Neumann post-processing circuit is implemented for maximum entropy harvesting. I-TRNG is fabricated in 130-nm CMOS technology. It occupies 1495 µm2 (0.08846 MF2) and consumes 0.6585 pJ/bit with a throughput of 0.4456 Mbps (0.1308 Mbits/µW). The random bits generated by I- TRNG pass all FIPS 140-2 and NIST 800-22 tests.

Original languageEnglish
Title of host publication2020 IEEE 63rd International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages285-288
Number of pages4
ISBN (Electronic)9781538629161
DOIs
Publication statusPublished - 2020 Aug
Event63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Springfield, United States
Duration: 2020 Aug 92020 Aug 12

Publication series

NameMidwest Symposium on Circuits and Systems
Volume2020-August
ISSN (Print)1548-3746

Conference

Conference63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020
CountryUnited States
CitySpringfield
Period20/8/920/8/12

Keywords

  • CMOS inverter
  • NIST tests
  • thermal noise
  • True random number generator
  • Von-Neumann post-processing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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